Invention Grant
- Patent Title: Solid-state imaging element and imaging device
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Application No.: US18041220Application Date: 2021-06-21
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Publication No.: US12177591B2Publication Date: 2024-12-24
- Inventor: Daisuke Nakagawa , Yosuke Ueno , Kouji Matsuura
- Applicant: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Current Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: CHIP LAW GROUP
- Priority: JP2020-138539 20200819
- International Application: PCT/JP2021/023354 WO 20210621
- International Announcement: WO2022/038885 WO 20220224
- Main IPC: H04N25/772
- IPC: H04N25/772 ; H04N25/709 ; H04N25/76 ; H04N25/78

Abstract:
A degree of freedom in design is improved in a solid-state imaging element in which a logic gate is provided in a comparator. A comparison circuit compares an input potential which has been input with a predetermined reference potential and outputs any one of a pair of output potentials as a comparison result. A level shift circuit outputs any one of a pair of shift potentials having a larger potential difference than the pair of output potentials as an output signal on the basis of the comparison result. The logic gate determines whether or not the output signal is higher than a predetermined threshold between the pair of shift potentials and outputs a determination result. A counter counts a count value over a period until the determination result is inverted.
Public/Granted literature
- US20230345151A1 SOLID-STATE IMAGING ELEMENT AND IMAGING DEVICE Public/Granted day:2023-10-26
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