Solid-state imaging element and imaging device
Abstract:
A degree of freedom in design is improved in a solid-state imaging element in which a logic gate is provided in a comparator. A comparison circuit compares an input potential which has been input with a predetermined reference potential and outputs any one of a pair of output potentials as a comparison result. A level shift circuit outputs any one of a pair of shift potentials having a larger potential difference than the pair of output potentials as an output signal on the basis of the comparison result. The logic gate determines whether or not the output signal is higher than a predetermined threshold between the pair of shift potentials and outputs a determination result. A counter counts a count value over a period until the determination result is inverted.
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