Provided are methods and apparatuses for testing imaging devices, which can include a testing apparatus a testing apparatus including a test chamber; a device receptacle inside the test chamber for holding a device under test; a target receptacle inside the test chamber for holding an optical target within a field of view of the device under test; a temperature controller configured to adjust a temperature proximate to the device receptacle; and an air curtain controller configured to generate an air curtain inside the test chamber between a location of the device receptacle and a location of the target receptacle, the air curtain thermally isolating the device receptacle from the target receptacle.