Invention Grant
- Patent Title: Variable resistance memory device
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Application No.: US18119970Application Date: 2023-03-10
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Publication No.: US12185647B2Publication Date: 2024-12-31
- Inventor: Wonjun Park , Chungman Kim , Dongho Ahn , Changyup Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2022-0034938 20220321
- Main IPC: G11C11/00
- IPC: G11C11/00 ; H10B63/00 ; H10N70/00 ; H10N70/20

Abstract:
A variable resistance memory device includes a first conductive line extending on a substrate in a first horizontal direction; a second conductive line extending on the first conductive line in a second horizontal direction perpendicular to the first horizontal direction; and a memory cell at an intersection between the first conductive line and the second conductive line, the memory cell including a selection element and a variable resistor, wherein the variable resistor includes a first variable resistance layer having a senary component represented by CaGebSbcTedAeXf, in which A and X are each a group 13 element different from each other, and 1≤a≤18, 13≤b≤26, 15≤c≤30, 35≤d≤55, 0.1≤e≤8, 0.1≤f≤8, and a+b+c+d+e+f=100.
Public/Granted literature
- US20230301218A1 VARIABLE RESISTANCE MEMORY DEVICE Public/Granted day:2023-09-21
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