Invention Grant
- Patent Title: Method of forming engineered wafers
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Application No.: US16201821Application Date: 2018-11-27
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Publication No.: US12191192B2Publication Date: 2025-01-07
- Inventor: Bing Hu
- Applicant: Bing Hu
- Applicant Address: US TX Dallas
- Assignee: Bing Hu
- Current Assignee: Bing Hu
- Current Assignee Address: US TX Dallas
- Agent Chad Peterson
- Priority: CN201810940626.9 20180817,CN201510599390 20180918
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L21/02 ; H01L29/45 ; H01L29/47 ; H01L33/00

Abstract:
Ions are implanted into a first wafer through a top side, generating an ion damaged layer underneath the substrate film of the first wafer. A stress inducing layer is applied on a surface on the top side of the first wafer on one of the ion implanted side and the opposite side. The substrate film is separated from the first wafer at the ion damaged layer. the separated substrate film is bonded to a second wafer at a surface on one of a first side and a second side that this opposite of the first side of the second wafer to form an engineered wafer.
Public/Granted literature
- US20200058542A1 METHOD OF FORMING ENGINEERED WAFERS Public/Granted day:2020-02-20
Information query
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