Invention Grant
- Patent Title: Time delay integration sensor handling defect pixels
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Application No.: US18503265Application Date: 2023-11-07
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Publication No.: US12192655B2Publication Date: 2025-01-07
- Inventor: Ren-Chieh Liu , Chao-Chi Lee , Yi-Yuan Chen , En-Feng Hsu
- Applicant: PIXART IMAGING INC. , TAIWAN SPACE AGENCY
- Applicant Address: TW Hsin-Chu County; TW Hsin-Chu
- Assignee: PIXART IMAGING INC.,TAIWAN SPACE AGENCY
- Current Assignee: PIXART IMAGING INC.,TAIWAN SPACE AGENCY
- Current Assignee Address: TW Hsin-Chu County; TW Hsin-Chu
- Agency: HAUPTMAN HAM, LLP
- Priority: TW110138441 20211015
- Main IPC: H04N25/768
- IPC: H04N25/768 ; H04N25/531 ; H04N25/75

Abstract:
The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by the time ratio of the line time difference and the frame period. The TDI sensor further records defect pixels of a pixel array such that in integrating pixel data to integrators, the pixel data associated with the defect pixels is not integrated into corresponding integrators.
Public/Granted literature
- US20240073563A1 TIME DELAY INTEGRATION SENSOR HANDLING DEFECT PIXELS Public/Granted day:2024-02-29
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