Invention Grant
- Patent Title: Interconnection structure, circuit and electronic apparatus including the interconnection structure or circuit
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Application No.: US17594753Application Date: 2019-05-30
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Publication No.: US12199031B2Publication Date: 2025-01-14
- Inventor: Huilong Zhu
- Applicant: Institute of Microelectronics, Chinese Academy of Sciences
- Applicant Address: CN Beijing
- Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee Address: CN Beijing
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: CN201910369630.9 20190505
- International Application: PCT/CN2019/089286 WO 20190530
- International Announcement: WO2020/224018 WO 20201112
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/528

Abstract:
An interconnection structure for semiconductor devices formed on a substrate may be arranged under the semiconductor devices. The interconnection structure includes at least one via layer and at least one interconnection layer alternately arranged in a direction from the semiconductor device to the substrate, wherein each via layer includes via holes respectively arranged under at least a part of the semiconductor devices, and each interconnection layer includes conductive nodes respectively arranged under at least a part of the semiconductor devices, and in a same interconnection layer, a conductive channel is provided between at least one conductive node and at least another node; and the via holes in each via layer and the conductive nodes in each interconnection layer corresponding to the via holes at least partially overlap with each other in the direction from the semiconductor device to the substrate.
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Information query
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