Invention Grant
- Patent Title: Method and apparatus with image analysis
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Application No.: US17574959Application Date: 2022-01-13
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Publication No.: US12211193B2Publication Date: 2025-01-28
- Inventor: Youngbum Hur , Jinwoo Shin , Jihoon Tack
- Applicant: Samsung Electronics Co., Ltd. , Korea Advanced Institute of Science and Technology
- Applicant Address: KR Suwon-si; KR Daejeon
- Assignee: Samsung Electronics Co., Ltd.,Korea Advanced Institute of Science and Technology
- Current Assignee: Samsung Electronics Co., Ltd.,Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Suwon-si; KR Daejeon
- Agency: NSIP Law
- Priority: KR10-2021-0074145 20210608,KR10-2021-0095455 20210721
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T3/60 ; G06T11/00 ; G06V10/40 ; G06V10/764 ; G06V10/77 ; G06V10/774 ; G06V10/82

Abstract:
A processor-implemented method with image analysis includes: receiving a test image; generating a plurality of augmented images by augmenting the test image; determining classification prediction values for the augmented images using a classifier; determining a detection score based on the classification prediction values; and determining whether the test image corresponds to anomaly data based on the detection score and a threshold.
Public/Granted literature
- US20220392051A1 METHOD AND APPARATUS WITH IMAGE ANALYSIS Public/Granted day:2022-12-08
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