Invention Grant
- Patent Title: Optical measurement tool containing chromatic aberration enhancement component and optical alignment method using the same
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Application No.: US17662758Application Date: 2022-05-10
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Publication No.: US12211724B2Publication Date: 2025-01-28
- Inventor: Michio Ohi , Maki Ueda , Hiroki Mayumi
- Applicant: SANDISK TECHNOLOGIES LLC
- Applicant Address: US TX Addison
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Addison
- Agency: THE MARBURY LAW GROUP PLLC
- Main IPC: H01L23/544
- IPC: H01L23/544 ; G02B27/34 ; G06T7/00 ; G06T7/66 ; G06T7/73 ; H01L21/68 ; H04N23/56

Abstract:
An optical alignment method includes providing an emitted radiation beam which includes a first peak wavelength and a second peak wavelength to a chromatic aberration enhancement component which increases a chromatic aberration of the emitted radiation beam, providing a first incident radiation beam having the first peak wavelength and a second incident radiation beam having the second peak wavelength which is shorter than the first peak wavelength to respective first and second alignment marks located at different vertical levels in a device under test, detecting reflected radiation from the first and second alignment marks, and using the detected reflected radiation for optical alignment of layers in the device under test.
Public/Granted literature
Information query
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