Invention Grant
- Patent Title: Automated sample weight measurement via optical inspection
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Application No.: US18196145Application Date: 2023-05-11
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Publication No.: US12219117B2Publication Date: 2025-02-04
- Inventor: Raf Peeters , Antoon De Cleen , Pieter Ieven , Ruben Praets
- Applicant: Qcify Inc.
- Applicant Address: US CA San Mateo
- Assignee: Qcify Inc.
- Current Assignee: Qcify Inc.
- Current Assignee Address: US CA San Mateo
- Agency: Imperium Patent Works LLP
- Agent Mark D. Marrello
- Main IPC: H04N13/243
- IPC: H04N13/243 ; G06T7/00 ; H04N23/56 ; H04N23/66 ; H04N13/254

Abstract:
A method includes the steps collecting measurement data of a sample utilizing an adaptable inspection unit or while the sample is in-flight, determining a volume or area of the sample based at least in part on the measurement data, and calculating a weight of the sample based at least in part on the volume or area of the sample. The measurement data includes a captured image that includes a plurality of pixels. The determining of the volume of the sample includes determining the number of pixels in the captured image that display a portion of the sample, or determining the maximum number of consecutive pixels that display a portion of the sample in two or three dimensions.
Public/Granted literature
- US20230283755A1 AUTOMATED SAMPLE WEIGHT MEASUREMENT VIA OPTICAL INSPECTION Public/Granted day:2023-09-07
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