Invention Grant
- Patent Title: Open microfocus x-ray source and control method thereof
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Application No.: US17558628Application Date: 2021-12-22
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Publication No.: US12224151B2Publication Date: 2025-02-11
- Inventor: Xiaojun Qiu , Wenwen Kong , Wei Zhang , Liucheng Wang , Qi Hou
- Applicant: Wuxi Unicomp Technology Co., Ltd.
- Applicant Address: CN Wuxi
- Assignee: Wuxi Unicomp Technology Co., Ltd.
- Current Assignee: Wuxi Unicomp Technology Co., Ltd.
- Current Assignee Address: CN Wuxi
- Agency: Bayramoglu Law Offices LLC
- Priority: CN202111006063.4 20210830
- Main IPC: H01J35/14
- IPC: H01J35/14 ; H05G1/46 ; H05G1/52 ; H01J35/06 ; H01J35/08

Abstract:
An open microfocus X-ray source and a control method thereof are provided. The open microfocus X-ray source includes: an open X-ray tube, a high voltage power supply (HVPS) system, a vacuum system and a control system. The open X-ray tube includes a cathode system, a deflection system and a focusing system. The HVPS system is configured to provide an emission current I0, an accelerating high voltage U0 and a grid voltage UG for an electron beam. The vacuum system is configured to perform vacuumization. The control system is configured to control, according to a spot size of an electron beam for bombarding an anode target, the HVPS system to adjust the emission current I0, the accelerating high voltage U0, a deflection coil current IXY of the deflection system, and a focusing coil current IF of the focusing system, such that the spot size meets a preset requirement.
Public/Granted literature
- US20230069290A1 OPEN MICROFOCUS X-RAY SOURCE AND CONTROL METHOD THEREOF Public/Granted day:2023-03-02
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