Invention Grant
- Patent Title: Systems and methods of control for plasma processing
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Application No.: US16219535Application Date: 2018-12-13
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Publication No.: US12230475B2Publication Date: 2025-02-18
- Inventor: Alok Ranjan , Peter Ventzek , Mitsunori Ohata
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Slater Matsil, LLP
- Main IPC: H01J37/32
- IPC: H01J37/32 ; C23C16/455 ; H01L21/3065 ; H01L21/67 ; H01L21/683

Abstract:
A plasma processing system includes a vacuum chamber, a first coupling electrode, a substrate holder disposed in the vacuum chamber, a second coupling electrode, and a controller. The substrate holder is configured to support a substrate. The first coupling electrode is configured to provide power for generation of a plasma in the vacuum chamber. The first coupling electrode is further configured to couple source power pulses to the plasma. The second coupling electrode is configured to couple bias power pulses to the substrate. The controller is configured to control a first offset duration between the source power pulses the bias power pulses.
Public/Granted literature
- US20200058469A1 SYSTEMS AND METHODS OF CONTROL FOR PLASMA PROCESSING Public/Granted day:2020-02-20
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