Invention Grant
- Patent Title: System and method for generating training data sets for specimen defect detection
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Application No.: US18449320Application Date: 2023-08-14
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Publication No.: US12243293B2Publication Date: 2025-03-04
- Inventor: Anuj Doshi , Jonathan Lee , John B. Putman
- Applicant: Nanotronics Imaging, Inc.
- Applicant Address: US OH Cuyahoga Falls
- Assignee: Nanotronics Imaging, Inc.
- Current Assignee: Nanotronics Imaging, Inc.
- Current Assignee Address: US OH Cuyahoga Falls
- Agency: DLA PIPER LLP (US)
- Main IPC: G06V10/774
- IPC: G06V10/774 ; G06T7/00 ; G06V10/22

Abstract:
A system and method for generating a training data set for training a machine learning model to detect defects in specimens is described herein. A computing system cause presentation of an image on a device of a user. The image includes at least one defect on an example specimen. The computing system receives an annotated image from the user. The user annotated the image using an input via the device. The input includes a first indication of a location of the defect and a second indication of a class corresponding to the defect. The computing system adjusts the annotated image to standardize the input based on an error profile of the user and the class corresponding to the defect. The computing system uploads the annotated image for training the machine learning model.
Public/Granted literature
- US20230394801A1 System and Method for Generating Training Data Sets for Specimen Defect Detection Public/Granted day:2023-12-07
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