Invention Grant
- Patent Title: Multi-modal test-time adaptation
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Application No.: US17903393Application Date: 2022-09-06
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Publication No.: US12254681B2Publication Date: 2025-03-18
- Inventor: Yi-Hsuan Tsai , Bingbing Zhuang , Samuel Schulter , Buyu Liu , Sparsh Garg , Ramin Moslemi , Inkyu Shin
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Agent Joseph Kolodka
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01S17/89 ; G06V10/776 ; G06V10/80

Abstract:
Systems and methods are provided for multi-modal test-time adaptation. The method includes inputting a digital image into a pre-trained Camera Intra-modal Pseudo-label Generator, and inputting a point cloud set into a pre-trained Lidar Intra-modal Pseudo-label Generator. The method further includes applying a fast 2-dimension (2D) model, and a slow 2D model, to the inputted digital image to apply pseudo-labels, and applying a fast 3-dimension (3D) model, and a slow 3D model, to the inputted point cloud set to apply pseudo-labels. The method further includes fusing pseudo-label predictions from the fast models and the slow models through an Inter-modal Pseudo-label Refinement module to obtain robust pseudo labels, and measuring a prediction consistency for the pseudo-labels. The method further includes selecting confident pseudo-labels from the robust pseudo labels and measured prediction consistencies to form a final cross-modal pseudo-label set as a self-training signal, and updating batch parameters utilizing the self-training signal.
Public/Granted literature
- US20230081913A1 MULTI-MODAL TEST-TIME ADAPTATION Public/Granted day:2023-03-16
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