Invention Grant
- Patent Title: Foreign matter detection system
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Application No.: US17528850Application Date: 2021-11-17
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Publication No.: US12254695B2Publication Date: 2025-03-18
- Inventor: Kenichi Hamaguchi , Hiroaki Imaizumi , Jingyu Hu , Takanori Nishimura , Kenichi Nakamura
- Applicant: IHI CORPORATION
- Applicant Address: JP Tokyo
- Assignee: IHI CORPORATION
- Current Assignee: IHI CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2019-094737 20190520
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G06V10/147 ; G06V20/52 ; G08B21/18

Abstract:
Provided are an image capturing device for capturing an image in a target area, transmission parts through which an outside can be visually observed from inside of the target area and polarizing filters on an light path from the transmission parts to the image capturing device. The front- and depth-side polarizing filters relative to the image capturing device are arranged so as to have polarizing directions crossing each other. A foreign matter in the target area is detected on the basis of the image acquired by the image capturing device.
Public/Granted literature
- US20220076029A1 FOREIGN MATTER DETECTION SYSTEM Public/Granted day:2022-03-10
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