Invention Grant
- Patent Title: Temperature-controlled driver with built-in self testing of switch status
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Application No.: US18350325Application Date: 2023-07-11
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Publication No.: US12255649B2Publication Date: 2025-03-18
- Inventor: Jeffrey A. Dykstra , Rodd E. Novak
- Applicant: Murata Manufacturing Co., Ltd.
- Applicant Address: JP Nagaokakyo
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Nagaokakyo
- Agency: Steinfl + Bruno LLP
- Main IPC: H03K3/017
- IPC: H03K3/017

Abstract:
Methods and devices for reading and programming a state of a switch device are presented. The programming of the state of the switch device is performed by providing driving pulses to the switch device. The amplitude and the width of the driving pulses are a function of one or more of a) temperature of the switch device, b) desired state of the switch device, and c) operational time of the switch device. The described devices include a device to store the data demonstrating the functional relation between the amplitude and the width of the driving pulses and the temperature of the switch device. Such device can be a lookup table or an arithmetic logic unit (ALU). The disclosed switch devices can be PCM switches.
Public/Granted literature
- US20240106420A1 TEMPERATURE-CONTROLLED DRIVER WITH BUILT-IN SELF TESTING OF SWITCH STATUS Public/Granted day:2024-03-28
Information query
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