Invention Grant
- Patent Title: Defect detection method and apparatus, and computer-readable storage medium
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Application No.: US18356232Application Date: 2023-07-21
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Publication No.: US12266091B2Publication Date: 2025-04-01
- Inventor: Zhiyu Wang , Xi Wang , Guannan Jiang
- Applicant: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Applicant Address: CN Hong Kong
- Assignee: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Current Assignee: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Current Assignee Address: CN Hong Kong
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G06T7/00
- IPC: G06T7/00

Abstract:
Provided are a defect detection method and apparatus, and a computer-readable storage medium. Specifically, the method includes: obtaining a to-be-detected image; obtaining a feature map of the to-be-detected image based on the to-be-detected image, where the feature map of the to-be-detected image includes a feature map of spatial position coordinate information; and performing defect detection on the to-be-detected image based on the feature map of the to-be-detected image. By modifying a neural network structure of defect detection and extracting the feature map of spatial position coordinate information during the detection, this application makes the neural network for use of defect detection sensitive to a spatial position, thereby enhancing sensitivity of a detection neural network to the spatial position, and in turn, increasing accuracy of detecting some specific defect types by the detection neural network, and increasing accuracy of defect detection.
Public/Granted literature
- US20240070840A1 DEFECT DETECTION METHOD AND APPARATUS, AND COMPUTER-READABLE STORAGE MEDIUM Public/Granted day:2024-02-29
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