- Patent Title: Low stress die attachment for thermal imaging focal plane arrays
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Application No.: US17576296Application Date: 2022-01-14
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Publication No.: US12266677B2Publication Date: 2025-04-01
- Inventor: Lars Mininni , Shawn Dirksen , Thad Miller
- Applicant: Seek Thermal, Inc.
- Applicant Address: US CA Goleta
- Assignee: Seek Thermal, Inc.
- Current Assignee: Seek Thermal, Inc.
- Current Assignee Address: US CA Goleta
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L21/60 ; H01L31/18 ; H04N5/33 ; H04N23/55

Abstract:
Devices and methods that result in very low stress circuit die attachment to substrates such as PCB's and flex circuits are described. Stress, due to thermal expansion mismatches, is reduced by reducing the amount of die bonding area that is covered by adhesive material. In some instances, the area left uncovered by adhesive material may be all or partially filled with a low viscosity material that may also be thermally conductive, such as thermal grease. Reducing the contact area between the die and inherently low elasticity adhesives reduces the mechanical effect of thermal mismatches between the die and the substrate. The provided techniques are particularly beneficial when used to bond uncooled thermal imaging FPA dies to substrates.
Public/Granted literature
- US20220231059A1 LOW STRESS DIE ATTACHMENT FOR THERMAL IMAGING FOCAL PLANE ARRAYS Public/Granted day:2022-07-21
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