- Patent Title: Optical field imaging system based on dual galvanometer scanning
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Application No.: US18791474Application Date: 2024-08-01
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Publication No.: US12267602B2Publication Date: 2025-04-01
- Inventor: Yi Yang , Jun Yan
- Applicant: Zhejiang Hehu Technology Co., Ltd.
- Applicant Address: CN Hangzhou
- Assignee: Zhejiang Hehu Technology Co., Ltd.
- Current Assignee: Zhejiang Hehu Technology Co., Ltd.
- Current Assignee Address: CN Hangzhou
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: CN202310968757.9 20230803
- Main IPC: H04N5/335
- IPC: H04N5/335 ; G02B26/10 ; H04N23/55 ; H04N23/957

Abstract:
The present invention relates to the technical field of optical imaging, in particular to an optical field imaging system based on dual galvanometer scanning, comprising: an imaging unit, a galvanometer unit, a microlens array, a relay system and a camera which are arranged successively along a transmission direction of an optical path. The imaging unit is used for optically imaging a sample or a scenario. The galvanometer unit is composed of two non-parallel two-dimensional galvanometers which deflect beams in two directions of X axis and Y axis respectively, so that an input beam is perpendicular to an output beam. After the beam outputted by the galvanometer unit passes through the microlens array and the relay system, the beam is collected by the camera to obtain the stack information of optical field images.
Public/Granted literature
- US20240397215A1 Optical Field Imaging System Based On Dual Galvanometer Scanning Public/Granted day:2024-11-28
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