Invention Grant
- Patent Title: Manufacturing method of semiconductor device
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Application No.: US18363725Application Date: 2023-08-01
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Publication No.: US12278139B2Publication Date: 2025-04-15
- Inventor: Chi-Ming Chen , Kuei-Ming Chen , Po-Chun Liu , Chung-Yi Yu , Chia-Shiung Tsai
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L21/762 ; H01L21/768

Abstract:
A manufacturing method of a semiconductor device includes at least the following steps. A sacrificial substrate is provided. An epitaxial layer is formed on the sacrificial substrate. An etch stop layer is formed on the epitaxial layer. Carbon atoms are implanted into the etch stop layer. A capping layer and a device layer are formed on the etch stop layer. A handle substrate is bonded to the device layer. The sacrificial substrate, the epitaxial layer, and the etch stop layer having the carbon atoms are removed from the handle substrate.
Public/Granted literature
- US20230377946A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Public/Granted day:2023-11-23
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