Invention Grant
- Patent Title: Computing apparatus and margin measurement method
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Application No.: US17940569Application Date: 2022-09-08
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Publication No.: US12278672B2Publication Date: 2025-04-15
- Inventor: Ryota Higashi , Masao Ogihara
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Procopio, Cory, Hargreaves & Savitch LLP
- Priority: JP2021-203988 20211216
- Main IPC: H04B3/487
- IPC: H04B3/487 ; H04L25/08

Abstract:
A computing apparatus, includes a first apparatus and a second apparatus, a differential transmission line that couples the first apparatus and the second apparatus to each other, a noise application unit that applies noise to the differential transmission line, a noise control unit that controls the noise application unit, and a margin measurement unit that measures an occurrence frequency of communication error between the first apparatus and the second apparatus.
Public/Granted literature
- US20230198573A1 COMPUTING APPARATUS AND MARGIN MEASUREMENT METHOD Public/Granted day:2023-06-22
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