Method and system for defect inspection based on deep learning
Abstract:
The present disclosure in some embodiments provides a product inspection method and a system based on deep learning for detecting a product defect. The present disclosure provides a product inspection method and system for detecting product defects by linking a predeveloped deep learning-based classification model to interwork with the existing product inspection system while fine-tuning the classification model to be maintained or supplemented by instantly correcting errors of the classification model, thereby improving the accuracy of product quality inspection.
Public/Granted literature
Information query
Patent Agency Ranking
0/0