Invention Grant
- Patent Title: Method and system for defect inspection based on deep learning
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Application No.: US17515950Application Date: 2021-11-01
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Publication No.: US12283039B2Publication Date: 2025-04-22
- Inventor: Tae Hyun Kim , Hye Rin Kim , Yeong Jun Cho
- Applicant: HYUNDAI MOBIS CO., LTD.
- Applicant Address: KR Seoul
- Assignee: HYUNDAI MOBIS CO., LTD.
- Current Assignee: HYUNDAI MOBIS CO., LTD.
- Current Assignee Address: KR Seoul
- Agency: NovoTechIP International PLLC
- Priority: KR10-2020-0175771 20201215
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06F18/21 ; G06F18/214 ; G06F18/2413

Abstract:
The present disclosure in some embodiments provides a product inspection method and a system based on deep learning for detecting a product defect. The present disclosure provides a product inspection method and system for detecting product defects by linking a predeveloped deep learning-based classification model to interwork with the existing product inspection system while fine-tuning the classification model to be maintained or supplemented by instantly correcting errors of the classification model, thereby improving the accuracy of product quality inspection.
Public/Granted literature
- US20220189002A1 METHOD AND SYSTEM FOR DEFECT INSPECTION BASED ON DEEP LEARNING Public/Granted day:2022-06-16
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