Invention Grant
- Patent Title: Multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tilt
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Application No.: US17582504Application Date: 2022-01-24
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Publication No.: US12283457B2Publication Date: 2025-04-22
- Inventor: Nicole Rauwolf , Nico Kaemmer , Michael Behnke , Ingo Mueller , Dirk Zeidler , Arne Thoma , Christof Riedesel , Gunther Scheunert
- Applicant: Carl Zeiss MultiSEM GmbH
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss MultiSEM GmbH
- Current Assignee: Carl Zeiss MultiSEM GmbH
- Current Assignee Address: DE Oberkochen
- Agency: Fish & Richardson P.C.
- Priority: DE102021200799.6 20210129
- Main IPC: H01J37/21
- IPC: H01J37/21 ; G01N21/95 ; H01J37/26

Abstract:
A multiple particle beam microscope and an associated method set a desired focal plane with an optical resolution and set a telecentric irradiation with the plurality of the primary beams. A method determines an optimal setting plane, into which an object surface is brought. Further, a system provides an improved resolution and telecentric irradiation for a large number of primary beams. Targeted selection and targeted individual influencing of individual primary beams and/or a mechanism means for influencing the plurality of primary beams in collective fashion can be implemented.
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