Invention Grant
- Patent Title: Method of fabricating semiconductor device
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Application No.: US17726673Application Date: 2022-04-22
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Publication No.: US12293923B2Publication Date: 2025-05-06
- Inventor: Yangsoo Son
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2021-0120349 20210909
- Main IPC: H01L21/32
- IPC: H01L21/32 ; H01L21/3105 ; H01L21/47

Abstract:
A method of fabricating a semiconductor device includes forming a cut-off region in at least one mandrel line among a plurality of mandrel lines, conformally forming a spacer material layer in the plurality of mandrel lines and a non-mandrel area and forming a cut spacer in the cut-off region and depositing a gap-fill material such that a cut block is formed on a portion of the non-mandrel area and a concave portion of the cut spacer is filled.
Public/Granted literature
- US20230075390A1 METHOD OF FABRICATING SEMICONDUCTOR DEVICE Public/Granted day:2023-03-09
Information query
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