Using controlled gas pressure for backside wafer support
Abstract:
Embodiments described herein provide substrate support assemblies for retaining a surface of a substrate having one or more devices disposed on one or more surfaces of the substrate without contacting the one or more devices and preventing changes in profile of the substrate. The substrate support assembly allows for control of the substrate. The substrate support assembly includes a gas nozzle disposed through a body of the substrate support assembly. The gas nozzle provides a gas to the substrate. The gas is operable to provide pressure to the substrate to reduce contact on the substrate and to control the profile of the substrate.
Public/Granted literature
Information query
Patent Agency Ranking
0/0