Invention Grant
- Patent Title: Package structure and method of fabricating the same
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Application No.: US17180877Application Date: 2021-02-22
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Publication No.: US12300598B2Publication Date: 2025-05-13
- Inventor: Yi-Wen Wu , Hung-Jui Kuo , Ming-Che Ho
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/00 ; H01L23/532 ; H01L23/538 ; H01L25/10

Abstract:
Provided is a package structure including a die; an electrically connecting structure having a die attach region and a peripheral region surrounding the die attach region, wherein the die is disposed on the electrically connecting structure within the die attach region; an insulating protrusion disposed in the peripheral region and extending in a thickness direction of the die; a conductive structure disposed on the electrically connecting structure and encapsulating the insulating protrusion, wherein the conductive structure is electrically coupled to the electrically connecting structure and the die; and a dielectric structure disposed on the electrically connecting structure and encapsulating the die and the conductive structure.
Public/Granted literature
- US20210175168A1 PACKAGE STRUCTURE AND METHOD OF FABRICATING THE SAME Public/Granted day:2021-06-10
Information query
IPC分类: