- Patent Title: Limiting failures caused by dendrite growth on semiconductor chips
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Application No.: US17567322Application Date: 2022-01-03
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Publication No.: US12315836B2Publication Date: 2025-05-27
- Inventor: Dan Namishia , Mitch Flowers , Eng Wah Woo , Erwin Cohen
- Applicant: Wolfspeed, Inc.
- Applicant Address: US NC Durham
- Assignee: Wolfspeed, Inc.
- Current Assignee: Wolfspeed, Inc.
- Current Assignee Address: US NC Durham
- Agency: COATS & BENNETT, PLLC
- Main IPC: H01L23/00
- IPC: H01L23/00

Abstract:
A semiconductor chip comprises a substrate, a die attach material, and a die. The substrate comprises an upper surface and a lower surface opposing the upper surface. The die attach material is on the upper surface of the substrate. The die comprises a bottom surface bonded to the upper surface of the substrate by the die attach material, a top surface opposing the bottom surface, and a side wall adjacent to the top surface and the bottom surface. A shortest distance across an exterior of the side wall from the bottom surface to the top surface defines an exterior surface distance. The die further comprises a die height measured from where the side wall meets the bottom surface to where the side wall meets the top surface. The exterior surface distance is longer than the die height.
Public/Granted literature
- US20230215833A1 Limiting Failures Caused by Dendrite Growth on Semiconductor Chips Public/Granted day:2023-07-06
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