Invention Grant
- Patent Title: Passivation layers with rounded corners
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Application No.: US17690556Application Date: 2022-03-09
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Publication No.: US12322646B2Publication Date: 2025-06-03
- Inventor: Mingni Chang , Hsuan-Ming Huang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/311 ; H01L23/00 ; H01L23/522 ; H01L23/532

Abstract:
The present disclosure describes a structure with passivation layers with rounded corners and a method for forming such a structure. The method includes forming a first insulating layer on a substrate, where the substrate includes a first conductive structure. The method further includes forming an opening in the first insulating layer to expose the first conductive structure and forming a second conductive structure on the first insulating layer, where the second conductive structure is in contact with the first conductive structure through the opening. The method further includes removing a portion of the second conductive structure with a first etching condition, removing a portion of the first insulating layer with a second etching condition, different from the first etching condition, to form a rounded corner between a sidewall of the second conductive structure and a top surface of the first insulating layer, and depositing a second insulating layer on the first insulating layer and the second conductive structure.
Public/Granted literature
- US20230290673A1 Passivation Layers with Rounded Corners Public/Granted day:2023-09-14
Information query
IPC分类: