Invention Grant
- Patent Title: Adjustment of code rate as function of memory endurance state metric
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Application No.: US18611450Application Date: 2024-03-20
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Publication No.: US12326782B2Publication Date: 2025-06-10
- Inventor: Kishore Kumar Muchherla , Niccolo' Righetti , Sivagnanam Parthasarathy , Mustafa N. Kaynak , Mark A. Helm , James Fitzpatrick , Ugo Russo
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: LOWENSTEIN SANDLER LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/07 ; G06F11/14 ; G06F11/30 ; G06F13/16 ; G06F13/28 ; H03M13/11 ; H03M13/15

Abstract:
A method includes determining, by a processing device, a value of a memory endurance state metric associated with a segment of a memory device in a memory sub-system; determining a target value of a code rate based on the value of the memory endurance state metric, and adjusting the code rate of the memory device according to the target value, wherein the code rate reflects a ratio of a number of memory units designated for storing host-originated data to a total number of memory units designated for storing the host-originated data and error correction metadata.
Public/Granted literature
- US20240232013A1 ADJUSTMENT OF CODE RATE AS FUNCTION OF MEMORY ENDURANCE STATE METRIC Public/Granted day:2024-07-11
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