Invention Grant
- Patent Title: Using duplicate data for improving error correction capability
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Application No.: US18401251Application Date: 2023-12-29
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Publication No.: US12327048B2Publication Date: 2025-06-10
- Inventor: Jeffrey S. McNeil , Kishore Kumar Muchherla , Sivagnanam Parthasarathy , Patrick R. Khayat , Sundararajan Sankaranarayanan , Jeremy Binfet , Akira Goda
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G11C16/26 ; G11C16/04

Abstract:
A system can include a memory device and a processing device, operatively coupled with the memory device, to perform operations including reading a first copy of data stored in a first set of memory cells comprising a first memory cell, determining whether a threshold voltage of the first memory cell is within a first range of threshold voltages, responsive to determining that the threshold voltage of the first memory cell is within the first range of threshold voltages, reading a second copy of the data stored in a second set of memory cells comprising a second memory cell, determining whether a threshold voltage of the second memory cell is within a second range of threshold voltages, and responsive to determining that the threshold voltage of the second memory cell is outside the second range, using the second copy of the data.
Public/Granted literature
- US20240134571A1 USING DUPLICATE DATA FOR IMPROVING ERROR CORRECTION CAPABILITY Public/Granted day:2024-04-25
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