Invention Grant
- Patent Title: Deep learning based single frame super resolution microscopy image processing
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Application No.: US17822902Application Date: 2022-08-29
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Publication No.: US12327327B2Publication Date: 2025-06-10
- Inventor: Shuhuai Yao , Shengwang Du , Rong Chen
- Applicant: The Hong Kong University of Science and Technology
- Applicant Address: CN Hong Kong
- Assignee: The Hong Kong University of Science and Technology
- Current Assignee: The Hong Kong University of Science and Technology
- Current Assignee Address: CN Hong Kong
- Agency: S&F/WEHRW
- Main IPC: G06T3/4046
- IPC: G06T3/4046 ; G06T3/4076 ; G06T7/00

Abstract:
The present application provides methods, devices, systems and non-transitory computer readable storage media for image processing. In an aspect, there is provided a computer-implemented method of image processing, the method comprising: receiving a low resolution image of an object; generating an edge map of the low resolution image by an edge extractor; and inputting the edge map and the low resolution image to a neural network to reconstruct a super resolution image of the object, wherein the neural network is trained using a multicomponent loss function.
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