Invention Grant
- Patent Title: Sacrificial strings in a memory device to detect read disturb
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Application No.: US17877411Application Date: 2022-07-29
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Publication No.: US12334142B2Publication Date: 2025-06-17
- Inventor: Kishore Kumar Muchherla , Violante Moschiano , Akira Goda , Jeffrey S. McNeil , Eric N. Lee
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G11C11/4096
- IPC: G11C11/4096 ; G11C11/406 ; G11C11/4072 ; G11C11/408

Abstract:
Control logic in a memory device determines to initiate a string read operation on a first memory string of a plurality of memory strings in a block of a memory array, the block comprising a plurality of wordlines, wherein the first memory string is designated as a sacrificial string. The control logic further causes a read voltage to be applied to each of the plurality of wordlines concurrently and senses a level of current flowing through the sacrificial string while the read voltage is applied. In addition, the control logic identifies, based on the level of current flowing through the sacrificial string, whether a threshold level of read disturb has occurred on the block.
Public/Granted literature
- US20230060440A1 SACRIFICIAL STRINGS IN A MEMORY DEVICE TO DETECT READ DISTURB Public/Granted day:2023-03-02
Information query
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