Invention Grant
- Patent Title: Scheme to fetch optimal read parameters by skipping invalid wordlines
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Application No.: US18383820Application Date: 2023-10-25
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Publication No.: US12334169B2Publication Date: 2025-06-17
- Inventor: Darshan Pagariya , Vishal Sharma
- Applicant: WESTERN DIGITAL TECHNOLOGIES, INC.
- Applicant Address: US CA San Jose
- Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
- Current Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
- Current Assignee Address: US CA San Jose
- Agency: Neal Blibo LLC
- Agent Arlene P. Neal
- Main IPC: G11C29/12
- IPC: G11C29/12

Abstract:
A storage device updates optimal parameters associated with a Thermal Region Tag (TRT). A controller on the storage device assigns a TRT to blocks programmed at a given temperature range and updates an optimal TRT parameters by obtaining a set of representative wordlines and a set of indicative wordlines for a block assigned to the TRT. The controller performs a bit error rate (BER) estimation on indicative wordlines in the set until a valid indicative wordline is found. The controller determines whether a BER Estimation Scan (BES) check is to be performed when the valid indicative wordline is found. In performing the BES check, the controller performs the BER estimation on representative wordlines in the set until a valid representative wordline is found. When a valid representative wordline is found, the controller obtains the optimal TRT parameter and updates the optimal TRT parameter.
Public/Granted literature
- US20250140331A1 SCHEME TO FETCH OPTIMAL READ PARAMETERS BY SKIPPING INVALID WORDLINES Public/Granted day:2025-05-01
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