Invention Grant
- Patent Title: Method of forming material layer
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Application No.: US17547626Application Date: 2021-12-10
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Publication No.: US12334357B2Publication Date: 2025-06-17
- Inventor: Kyung-Eun Byun , Sangwoo Kim , Minsu Seol , Hyeonjin Shin , Minseok Shin , Pin Zhao , Taehyeong Kim , Jaehwan Jung
- Applicant: Samsung Electronics Co., Ltd. , RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Applicant Address: KR Suwon-si; KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee: Samsung Electronics Co., Ltd.,RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY
- Current Assignee Address: KR Suwon-si; KR Gyeonggi-do
- Agency: HARNESS, DICKEY & PIERCE, P.L.C.
- Priority: KR10-2021-0016843 20210205
- Main IPC: C23C14/06
- IPC: C23C14/06 ; H01J37/34 ; H01L21/308

Abstract:
A method of forming a material film includes providing a non-photosensitive mask on a substrate to expose a partial region of the substrate, forming a material film on the partial region of the substrate using a sputtering process, removing the non-photosensitive mask, and heat-treating the substrate and the material film from which the non-photosensitive mask is removed under a first gas atmosphere. The material film includes a transition metal and a chalcogen element. The sputtering process may include an RF magnetron sputtering process. The heat treatment may be performed at a higher temperature than a temperature of the forming the material film.
Public/Granted literature
- US20220254643A1 METHOD OF FORMING MATERIAL LAYER Public/Granted day:2022-08-11
Information query
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