Invention Grant
- Patent Title: Defect detection using synthetic data and machine learning
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Application No.: US18631650Application Date: 2024-04-10
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Publication No.: US12340498B2Publication Date: 2025-06-24
- Inventor: Edward R. Kernick , Peter Cerreta
- Applicant: Johnson & Johnson Vision Care, Inc.
- Applicant Address: US FL Jacksonville
- Assignee: Johnson & Johnson Vision Care, Inc.
- Current Assignee: Johnson & Johnson Vision Care, Inc.
- Current Assignee Address: US FL Jacksonville
- Agent Kristina Okafor
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06F18/21 ; G06F18/214 ; G06N3/04

Abstract:
A method for quality control of contact lens packages comprises receiving a first data set comprising a plurality of images of a contact lens package having physically implanted defects; receiving a second data set comprising a plurality of images of a contact lens package having digitally implanted defects; testing and training, on the first and second data set, a model to determine a validated one or more quality control models; capturing image data of a package of a contact lens; analyzing, based on the validated one or more quality control models, the image data; and causing, based on the analyzing, output of a quality control metric indicative of at least an accept or reject condition of the package.
Public/Granted literature
- US20240257332A1 DEFECT DETECTION USING SYNTHETIC DATA AND MACHINE LEARNING Public/Granted day:2024-08-01
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