Invention Grant
- Patent Title: Testing system for high-frequency modulators
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Application No.: US18129549Application Date: 2023-03-31
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Publication No.: US12341565B2Publication Date: 2025-06-24
- Inventor: Flavio Dell'Orto , Marco Villa
- Applicant: LUMENTUM TECHNOLOGY UK LIMITED
- Applicant Address: GB Northamptonshire
- Assignee: LUMENTUM TECHNOLOGY UK LIMITED
- Current Assignee: LUMENTUM TECHNOLOGY UK LIMITED
- Current Assignee Address: GB Northamptonshire
- Agency: Harrity & Harrity, LLP
- Main IPC: H04B17/13
- IPC: H04B17/13 ; H04B17/10 ; H04B17/20

Abstract:
A testing system for a modulator includes a radio frequency (RF) generator, an optical power meter, and an electrical power meter. The RF generator is configured to generate and provide a first plurality of RF signals and a second plurality of RF signals, wherein the first plurality of RF signals and the second plurality of RF signals are associated with a plurality of frequencies. The optical power meter is configured to measure an optical power of an output optical signal, which is modulated by the modulator based on the first plurality of RF signals, to facilitate determination of a transmission response measurement of the modulator for each frequency of the plurality of frequencies. The electrical power meter is configured to measure a portion of each RF signal of the second plurality of RF signals to facilitate determination of a reflectance response measurement of the modulator for each frequency.
Public/Granted literature
- US20240259117A1 TESTING SYSTEM FOR HIGH-FREQUENCY MODULATORS Public/Granted day:2024-08-01
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