A measuring apparatus includes a dielectric block, a film layer which is formed on a first face of the dielectric block and is brought into contact with a sample, an optical system which causes a light beam to enter the dielectric block through a second face so that the light beam is reflected in total internal reflection at the interface of the dielectric block and the film layer and various angles of incidence of the light beam to the interface can be obtained, and a photodetector which detects the intensity of the light beam which is reflected in total internal reflection at the interface and goes outside the dielectric block through a third face thereof. A measuring chip includes a single dielectric block having all the first to third faces and the film layer integrally formed on the first face of the dielectric block.