Invention Application
- Patent Title: Controlled cleavage using patterning
- Patent Title (中): 使用图案化控制切割
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Application No.: US09878152Application Date: 2001-06-07
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Publication No.: US20020056519A1Publication Date: 2002-05-16
- Inventor: Francois J. Henley , Nathan W. Cheung
- Main IPC: B32B005/16
- IPC: B32B005/16

Abstract:
A technique for forming a film of material (12) from a donor substrate (10). The technique has a step of introducing energetic particles (22) in a selected manner through a surface of a donor substrate (10) to form a pattern at a selected depth (20) underneath the surface. The particles have a concentration sufficiently high to define a donor substrate material (12) above the selected depth. An energy source is directed to a selected region of the donor substrate to initiate a controlled cleaving action of the substrate (10) at the selected depth (20), whereupon the cleaving action provides an expanding cleave front to free the donor material from a remaining portion of the donor substrate.
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