Invention Application
- Patent Title: Nonintrusive inspection system
- Patent Title (中): 非侵入式检查系统
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Application No.: US10071993Application Date: 2002-02-07
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Publication No.: US20020071524A1Publication Date: 2002-06-13
- Inventor: Gerhard Renkart , Francois A. Mesqui , David E. Kresse , William H. Baylis
- Main IPC: H01J035/10
- IPC: H01J035/10 ; H01J035/12

Abstract:
An x-ray technique-based nonintrusive inspection apparatus is provided which is capable of inspecting 600 containers an hour which is small, and which is easily maintainable. Features of the apparatus include nullradiation lockingnull with nullactive curtainsnull, nullcontinuous scanningnull utilizing an x-ray line scanner subsystem and a CT scanner subsystem, good structural integrity, radiation containment in a self-shielding manner, an easily maintainable driving arrangement, shielding curtains that can be raised and lowered quickly, a container jam release mechanism, and efficient air conditioning.
Public/Granted literature
- US06957913B2 Nonintrusive inspection apparatus Public/Granted day:2005-10-25
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