Invention Application
US20020078759A1 Apparatus and method for ultrasonic stress measurement using the critically refracted longitudinal ( lcr ) ultrasonic technique 失效
使用重力折射纵向(lcr)超声技术进行超声波应力测量的装置和方法

  • Patent Title: Apparatus and method for ultrasonic stress measurement using the critically refracted longitudinal ( lcr ) ultrasonic technique
  • Patent Title (中): 使用重力折射纵向(lcr)超声技术进行超声波应力测量的装置和方法
  • Application No.: US09573053
    Application Date: 2000-05-16
  • Publication No.: US20020078759A1
    Publication Date: 2002-06-27
  • Inventor: Don E. Bray
  • Main IPC: G01L001/00
  • IPC: G01L001/00
Apparatus and method for ultrasonic stress measurement using the critically refracted longitudinal ( lcr ) ultrasonic technique
Abstract:
The latent stress in both flat and curved materials can be measured using critically refracted longitudinal ultrasonic technique. The system uses a frame to hold a hydraulic piston. The piston is used to apply an adjustable force against the probes. A signal is initiated by a transmitting probe. The signal is angled against the piece under test so as to create a critically refracted wave along the piece. Wedge-shaped probe pads allow placement of the probes on both flat and curved surfaces with various radii and arc lengths. The delay time to receive the wave at a first and second receiving probe is measured. The delay time correlates to a stress in the piece.
Information query
Patent Agency Ranking
0/0