Invention Application
US20030234920A1 Device for measuring colour, lustre and undulations on lacquered freeform surfaces 有权
用于测量涂漆自由曲面上的颜色,光泽和起伏的装置

  • Patent Title: Device for measuring colour, lustre and undulations on lacquered freeform surfaces
  • Patent Title (中): 用于测量涂漆自由曲面上的颜色,光泽和起伏的装置
  • Application No.: US10257286
    Application Date: 2003-07-02
  • Publication No.: US20030234920A1
    Publication Date: 2003-12-25
  • Inventor: Johannes Fleischer
  • Main IPC: G01J003/46
  • IPC: G01J003/46 G01N021/00
Device for measuring colour, lustre and undulations on lacquered freeform surfaces
Abstract:
The invention relates to a device for measuring colour, lustre and undulations on lacquered freeform surfaces at a predetermined target distance and symmetrically in relation to the measuring point normal lines at a measuring point. Said device is characterised by the provision of a measuring head that can be displaced in three dimensions by at least one motor and that comprises a measuring-head axis, a light emitter and a video camera. The light emitter is provided with a planar light pattern that is to be emitted along its illumination axis. An evaluation unit is provided for the light pattern (reproduction pattern) of the light emitter that is reproduced in the video camera, said evaluation unit emitting a control signal which is dependent on and formed from the distortion produced or the migration of the reproduction pattern. The measuring head is provided with a motor control, to whose input the control signal of the evaluation unit is applied and the measuring head is displaced in order to reduce the distortion or the migration of the reproduction pattern in the video camera to below a predetermined value, in such a way that both the measuring head axis coincides with the measuring point normal lines and the vertex of the angle formed by the illumination axis of the light emitter and the optical axis of the video camera coincides with the measuring point.
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