Invention Application
- Patent Title: Handy internal quality inspection instrument
- Patent Title (中): 方便内部质量检测仪器
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Application No.: US10475472Application Date: 2003-10-21
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Publication No.: US20040130720A1Publication Date: 2004-07-08
- Inventor: Hiromu Maeda , Toshihiro Mizuno
- Priority: JP2001=128098 20010425
- Main IPC: G01J003/28
- IPC: G01J003/28 ; G01N021/25

Abstract:
A compact handy type inspection instrument is provided for conducting readily nondestructive inspection of an inspection object in any working site. The inspection instrument comprises a spectroscope assembly containing an optical fiber-arranging member for arranging and holding a light-outputting end of an optical fiber bundle to be flat in a uniform layer thickness, a packaged compact spectroscope which is enclosed in a package having a slit-shaped light inlet window on a side confronting the rectilinear light-outputting end of the optical fiber-arranging member and is constituted of linear type continuous variable interference filter, a microlens array, and a linear type silicon array sensor assembled in the named order from the side of the light inlet window toward the opposite side, and a positioning device for positioning the rectilinear light-outputting end of the optical fiber bundle to fit to the light input window; and a detection head; incorporated together into a main body casing.
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