Invention Application
- Patent Title: Using surface microwaves for measuring and determining density and/or moisture content of a material
- Patent Title (中): 使用表面微波测量和确定材料的密度和/或水分含量
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Application No.: US10651247Application Date: 2003-08-29
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Publication No.: US20050057263A1Publication Date: 2005-03-17
- Inventor: Danny Moshe , Alexander Greenwald
- Applicant: Danny Moshe , Alexander Greenwald
- Main IPC: G01N9/24
- IPC: G01N9/24 ; G01N22/04 ; G01R27/04 ; G01R27/32

Abstract:
Using surface microwaves for measuring and determining density and/or moisture content of a material. Positioning material within a proximate free space region spanning immediately above surface of a surface microwave waveguide, the surface microwave waveguide includes an electrically conducting rectangular block and a dielectric rectangular insert element compactly fitting into the block. Transmitting microwaves into the first end of the surface microwave waveguide, a first portion of the transmitted microwaves propagate within the surface microwave waveguide and a second portion propagates within the proximate free space region including the material. Parameters (amplitude, phase, attenuation, and phase shift) of the propagating microwaves are perturbed by the material and are a function of density and/or moisture content of the material. Receiving the portions of propagating microwaves exiting the surface microwave waveguide, whereby the parameters of the transmitted and received microwaves are useable for determining density and/or moisture content of the material.
Public/Granted literature
- US06930492B2 Using surface microwaves for measuring and determining density and/or moisture content of a material Public/Granted day:2005-08-16
Information query