Invention Application
- Patent Title: Reflected ultraviolet light measuring device
- Patent Title (中): 反射紫外光测量装置
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Application No.: US10991369Application Date: 2004-11-19
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Publication No.: US20050104004A1Publication Date: 2005-05-19
- Inventor: Tohru Takeuchi , Yutaka Masuda
- Applicant: Tohru Takeuchi , Yutaka Masuda
- Applicant Address: JP Amagasaki-shi
- Assignee: KANSAI PAINT CO., LTD.
- Current Assignee: KANSAI PAINT CO., LTD.
- Current Assignee Address: JP Amagasaki-shi
- Priority: JP2003-388635 20031119
- Main IPC: G01N21/47
- IPC: G01N21/47 ; G01J5/00

Abstract:
A reflected ultraviolet light measuring device, a measuring method for measuring ultraviolet light reflection intensity by using the reflected ultraviolet light measuring device, and a valuation method for evaluating ultraviolet light absorbability of an object by using measuring results by the method, said device comprising an irradiating unit comprising a at least one light emitting diode for irradiating ultraviolet light on an object, and a light receiving unit for receiving a reflected light from the object, wherein the light receiving unit is arranged at an angle in which a regular reflected light from the object does not enter.
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