Invention Application
US20060079099A1 Ultra low k plasma enhanced chemical vapor deposition processes using a single bifunctional precursor containing both a SiCOH matrix functionality and organic porogen functionality
失效
使用含有SiCOH基质官能团和有机致孔剂功能的单一双功能前体的超低k等离子体增强化学气相沉积方法
- Patent Title: Ultra low k plasma enhanced chemical vapor deposition processes using a single bifunctional precursor containing both a SiCOH matrix functionality and organic porogen functionality
- Patent Title (中): 使用含有SiCOH基质官能团和有机致孔剂功能的单一双功能前体的超低k等离子体增强化学气相沉积方法
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Application No.: US10964254Application Date: 2004-10-13
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Publication No.: US20060079099A1Publication Date: 2006-04-13
- Inventor: Son Nguyen , Stephen Gates , Deborah Neumayer , Alfred Grill
- Applicant: Son Nguyen , Stephen Gates , Deborah Neumayer , Alfred Grill
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Main IPC: H01L21/31
- IPC: H01L21/31 ; H01L21/469

Abstract:
A method for fabricating a SiCOH dielectric material comprising Si, C, O and H atoms from a single organosilicon precursor with a built-in organic porogen is provided. The single organosilicon precursor with a built-in organic porogen is selected from silane (SiH4) derivatives having the molecular formula SiRR1R2R3, disiloxane derivatives having the molecular formula R4R5R6—Si—O—Si—R7R8R9, and trisiloxane derivatives having the molecular formula R10R11R12—Si—O—Si—R13R14—O—Si—R15R16R17 where R and R1-17 may or may not be identical and are selected from H, alkyl, alkoxy, epoxy, phenyl, vinyl, allyl, alkenyl or alkynyl groups that may be linear, branched, cyclic, polycyclic and may be functionalized with oxygen, nitrogen or fluorine containing substituents. In addition to the method, the present application also provides SiCOH dielectrics made from the inventive method as well as electronic structures that contain the same.
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