Invention Application
- Patent Title: Method for microscopy, and microscope
- Patent Title (中): 显微镜方法和显微镜
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Application No.: US11301439Application Date: 2005-12-13
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Publication No.: US20060097188A1Publication Date: 2006-05-11
- Inventor: Volker Seyfried
- Applicant: Volker Seyfried
- Applicant Address: DE Mannheim
- Assignee: Leica Microsystems Heidelberg GmbH
- Current Assignee: Leica Microsystems Heidelberg GmbH
- Current Assignee Address: DE Mannheim
- Priority: DEDE10228374.5 20020625
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
A method for microscopy includes generating pulsed illuminating light including wavelengths in a spectral region. A detection spectral region within the spectral region is defined. Using a dynamically controllable mask, light components of the illuminating light that comprise wavelengths within the detection spectral region are influenced. A specimen is illuminated with the influenced illuminating light. Detection light proceeding from the specimen within the detection spectral region is detected.
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