Invention Application
- Patent Title: AUTOMATED LASER HEADER TESTING
- Patent Title (中): 自动激光头测试
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Application No.: US11535350Application Date: 2006-09-26
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Publication No.: US20070069761A1Publication Date: 2007-03-29
- Inventor: Ting Shi , Daniel Tran , Pavel Ploscariu
- Applicant: Ting Shi , Daniel Tran , Pavel Ploscariu
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
Systems for automated laser header testing are disclosed. A system can include a base portion, a rotary stage supported by the base portion, at least one testing site supported by the rotary stage, and a plurality of testing stations supported by the base portion and radially arranged about a center point of the rotary stage for testing the laser header. Each testing site can include a testing fixture supported by the testing site. The testing fixture can include an air shield providing an isolated environment for testing the laser header. The testing fixture can further include a heat sink and air ducts for controlling testing conditions. Electrical contact members can releasably contact leads of the laser header and a releasing mechanism releases the leads of the laser header from the electrical contact members.
Public/Granted literature
- US07595630B2 Automated laser header testing Public/Granted day:2009-09-29
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