Invention Application
- Patent Title: SPECTROSCOPE WITH SPATIAL RESOLUTION CONTROL
- Patent Title (中): 具有空间分辨率控制的光谱
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Application No.: US11846508Application Date: 2007-08-28
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Publication No.: US20080049293A1Publication Date: 2008-02-28
- Inventor: Francis J. Deck
- Applicant: Francis J. Deck
- Main IPC: G02F1/01
- IPC: G02F1/01

Abstract:
In a spectrometer, preferably in a spectrometric microscope, light from a specimen is collected at a collector objective element and delivered to a camera element, which in turn provides the light to a photosensitive detector. A focal plane is provided between the collector objective element and the camera element, and one or more aperture arrays may be situated in the focal plane to restrict the detector's field of view of the specimen to the areas within the apertures. By utilizing aperture arrays with apertures of different sizes and shapes, the spatial resolution of the spectrometer readings may be varied without the need to vary the optics of the spectrometer. As a result, if the optics are optimized to minimize vignetting, spatial resolution may be varied without adverse increases in vignetting.
Public/Granted literature
- US07456950B2 Spectroscope with spatial resolution control Public/Granted day:2008-11-25
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