Invention Application
- Patent Title: MICROSCOPY SUPPORT STRUCTURES
- Patent Title (中): 显微镜支持结构
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Application No.: US12599339Application Date: 2008-05-09
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Publication No.: US20110079710A1Publication Date: 2011-04-07
- Inventor: John Damiano, JR. , Stephen E. Mick , David P. Nackashi
- Applicant: John Damiano, JR. , Stephen E. Mick , David P. Nackashi
- Applicant Address: US NC Raleigh
- Assignee: PROTOCHIPS, INC.
- Current Assignee: PROTOCHIPS, INC.
- Current Assignee Address: US NC Raleigh
- International Application: PCT/US2008/063200 WO 20080509
- Main IPC: G06K9/48
- IPC: G06K9/48 ; G21K1/04 ; H01L29/66

Abstract:
Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
Public/Granted literature
- US08872129B2 Microscopy support structures Public/Granted day:2014-10-28
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