Invention Application
- Patent Title: MACHINE AND METHOD FOR MEASURING A CHARACTERISTIC OF AN OPTICAL SIGNAL
- Patent Title (中): 用于测量光信号特性的机器和方法
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Application No.: US13294929Application Date: 2011-11-11
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Publication No.: US20120057153A1Publication Date: 2012-03-08
- Inventor: Prakash Kasturi , Adrian Nastase
- Applicant: Prakash Kasturi , Adrian Nastase
- Applicant Address: US CA Irvine
- Assignee: Newport Corporation
- Current Assignee: Newport Corporation
- Current Assignee Address: US CA Irvine
- Main IPC: G01J1/42
- IPC: G01J1/42

Abstract:
Machines and methods measure an unknown characteristic of an optical signal incident upon a detector characterized by one or more dynamic response parameters. One method receives an output signal from the detector and compares that output signal and a computationally determined response of the detector to a known optical signal incident upon the detector. The response is based on said one or more dynamic parameters. The method determines the unknown characteristic based on the comparison of the output signal and the computationally determined response of the detector. Another method receives an output signal from an optical detector detecting one or more optical signals, accesses a predetermined characteristic curve of detector response, compares the output signal from the detector to the predetermined characteristic curve of detector response, and calculates at least one unknown characteristic of one or more optical signals based on results of the comparing step.
Public/Granted literature
- US08400623B2 Machine and method for measuring a characteristic of an optical signal Public/Granted day:2013-03-19
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