Invention Application
- Patent Title: ELEMENTARY ANALYSIS APPARATUS AND METHOD
- Patent Title (中): 元素分析装置和方法
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Application No.: US13638186Application Date: 2011-03-25
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Publication No.: US20130201477A1Publication Date: 2013-08-08
- Inventor: Koji Kurita , Toshihiro Shirasaki , Hiroyuki Koshi
- Applicant: Koji Kurita , Toshihiro Shirasaki , Hiroyuki Koshi
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2010-091371 20100412
- International Application: PCT/JP2011/057319 WO 20110325
- Main IPC: G01N21/31
- IPC: G01N21/31

Abstract:
Provided herein is an elementary analysis apparatus allowing size and weight reduction and capable of performing atomic adsorption spectrometry by an electrothermal method and of forming plasma without using a gas. A sample is supplied from a liquid feed portion through a flow channel to an atomizing portion, and a voltage is applied between electrodes. When the voltage is applied to the electrodes, electric current and electric field are concentrated in the atomizing portion and bubbles are generated to cause a plasma in the bubbles, and element in the sample is atomized by the plasma. Light that irradiates the atomizing portion from a light source and is transmitted therethrough is received, for example, by an optical fiber or the like and split by a spectrophotometer. The amount of the split light is detected by a detector and analyzed by a computer.
Information query
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